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[New Dataset]: oxidized p(g3T2) #22

Description

@NJMarchese

--Dataset Name--

[New Dataset]: oxidized p(g3T2)

--Authors--

Nicholas Marchese; Department of Materials Science and Engineering, Stanford University, 496 Lomita Mall, Stanford, CA 94305, USA; 0009-0007-3490-4226
Arthur R. C. McCray; Department of Materials Science and Engineering, Stanford University, 496 Lomita Mall, Stanford, CA 94305, USA; 0000-0001-6077-4698
Yael Tsarfati; SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA; 0009-0006-5685-1279
Karen Bustillo; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA; 0000-0002-2096-6078
Adam Marks; Department of Materials Science and Engineering, Stanford University, 496 Lomita Mall, Stanford, CA 94305, USA; 0000-0001-9819-4349
Alberto Salleo; Department of Materials Science and Engineering, Stanford University, 496 Lomita Mall, Stanford, CA 94305, USA; 0000-0002-7448-9123
Colin Ophus; Department of Materials Science and Engineering, Stanford University, 496 Lomita Mall, Stanford, CA 94305, USA; 0000-0003-2348-8558

--URL--

https://drive.google.com/file/d/1wlc7b2UJajuIPebboa9QcIYy6hSqsD5e/view?usp=drive_link

--File Name--

STEM SI.dm4

--Checksum--

69b21bd01f2be786b2e5fa5b01a0d3b0

--Size (bytes)--

No response

--Description--

A 4DSTEM dataset of oxidized p(g3T2) polymer, an OMIEC material. The sample was cycled for 300 cycles from -0.3V to 0.3V, and then biased to 0.2V and vitrified under liquid ethane and kept at cryogenic conditions under liquid nitrogen. 48kX magnification, 210×210 pixels, step size of 10 nm, spot size of 6, 13.3 ms dwell time, binning of 4, 15 eV monochromator slit, convergence angle of 0.35 mrad, liquid nitrogen temperature. Taken January 9th, 2025.

--Detector Manufacturer--

Gatan

Detector Model

K3

Microscope Vendor

Thermo Fischer Scientific

Microscope Model

TEAM I

Camera Length

2700

Accelerating Voltage

300 kV

Dataset License

CC-BY-4.0

Technique

  • 4D-STEM
  • Cryo
  • Diffraction
  • EBSD
  • EDS
  • EELS
  • In-situ
  • Lorentz
  • Simulated
  • STEM
  • TEM
  • Tomography
  • Other
  • ML - atom tracing
  • ML - classification
  • ML - denoising
  • ML - peak finding
  • ML - phase retrieval
  • ML - segmentation
  • ML - other

DOI

https://doi.org/10.48550/arXiv.2607.16570

Tags

Nanobeam, polymers, machine learning, ML, TEM, 4DSTEM, 4D-STEM, peak finding, ionic, electronic, conductor, conjugated polymer, ML, OMIEC

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