An undergraduate DEVSIM teaching project for MICS3090, covering 1D p+-on-n silicon solar-cell simulation, visualization, experimental-data processing, and parameter calibration.
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Updated
Oct 2, 2026 - Jupyter Notebook
An undergraduate DEVSIM teaching project for MICS3090, covering 1D p+-on-n silicon solar-cell simulation, visualization, experimental-data processing, and parameter calibration.
COMSOL Multiphysics simulations of planar MOSFET, 3D FinFET, and Gate-All-Around FET (GAAFET) with carrier concentration and electrical characteristic analysis.
Local workbench for thin-film process recipes, 3D device geometry and silicon equilibrium, with a Quantum ESPRESSO workspace.
TCAD-based NMOS, PMOS, and CMOS inverter device characterization and simulation analysis.
Open-source multi-physics simulator for post-silicon and 3D-stacked transistors: 2D materials, CFET/GAA/M3D, thermal and yield. Never reports a number a solver didn't produce.
CCD-in-CMOS TDI pixel — end-to-end Sentaurus TCAD device simulation (real process flow, full-well capacity, QE, three-phase clock wells). Portfolio project.
Run and test embedded Linux applications on your host as if GPIO, SPI, I2C, UART, QSPI, and Ethernet devices were physically connected.
250 nm MOSFET process design and device simulation in Silvaco TCAD.
Open 1-D drift-diffusion solver for perovskite solar cells: band-gap-coupled photoinduced halide segregation, J-V, hysteresis and impedance. Pure NumPy/SciPy.
A physics-aware Bayesian optimization engine that drives any TCAD simulator to automatically optimize semiconductor devices.
Virtual CPE lab for TR-369/USP development and testing with a real OB-USP-AGENT, simulated TR-181 hardware, MQTT, fault injection, and a browser-based device UI.
Physics-first 0D/1D materials simulator, validation-first: pn-diode drift-diffusion, PEMFC/SOFC fuel cells and electrochemistry, each pinned to a source-cited reproduction test. Ships an MCP server exposing 9 guarded tools so AI agents can drive it. DEVSIM cross-check optional.
Device recovery experiments: durable worker ownership, real process crashes, external fault injection, and reproducible concurrency measurements.
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